B03 Reliability Assessment
When bringing new electronic devices – both logic and memory – into practical systems, reliability is often the limiting factor. In this TRR we expect new reliability effects to show up since we use BEOL compatible materials and processes that have inherent higher defect density as well as novel device architectures. The role of this project is to assess the reliability on the device level already in an early phase, give feedback to the projects of Research Area A for required improvements on the device level and build a database that can be used in Phase 2 and 3 to establish tailored fault and degradation models and tolerance strategies to overcome the identified reliability issues.
Maximilian Thomas Birch
RIKEN Center for Emergent Matter Science, Japan
Emergent phenomena in nanosculpted devices of quantum materials
Michael Niemier
Professor and Associate Department Chair, Computer Science and Engineering, University of Notre Dame, USA